A review of near-field laser ablation for high-resolution nanoscale surface analysis

Cleveland, Danielle (Department of Chemistry, University of Connecticut); Michel, Robert G.

Source: Applied Spectroscopy Reviews, v 43, n 2, 2008, p 93-110

ISSN: 0570-4928 CODEN: APSRBB

Publisher: Taylor and Francis Inc.

Abstract: Traditional laser ablation is a well-known method of solid sampling for surface characterization, but the resolution of the technique has been limited by the diameter of the incident laser beam and is typically on the order of 100-200 μm. Unfortunately, this microscale resolution can be too low to characterize isolated surface features that have submicron dimensions. Near-field laser ablation is an emerging analytical tool for nanoscale, high-resolution surface analysis. In this review, applications of near-field laser ablation for solid sample introduction are explored. Also, a descriptive overview of the near-field region is given, and methods of generating a near-field region and several processes for tip manufacture are described. (60 refs.)

 terms:  Surface analysis  -  Laser ablation  -  Laser applications  -  Lasers  -  Nanostructured materials  -  Nanotechnology  -  Optical variables measurement  -  Pulsed laser deposition